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Search for "torsional harmonic cantilevers" in Full Text gives 2 result(s) in Beilstein Journal of Nanotechnology.

High-resolution nanomechanical analysis of suspended electrospun silk fibers with the torsional harmonic atomic force microscope

  • Mark Cronin-Golomb and
  • Ozgur Sahin

Beilstein J. Nanotechnol. 2013, 4, 243–248, doi:10.3762/bjnano.4.25

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  • reliable method to investigate the mechanics of materials with complex geometries. Keywords: atomic force microscopy; nanomechanical characterization; silk fibers; tissue scaffolds; torsional harmonic cantilevers; Introduction Dynamic atomic force microscopy (AFM) methods provide opportunities for high
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Published 05 Apr 2013

Theoretical study of the frequency shift in bimodal FM-AFM by fractional calculus

  • Elena T. Herruzo and
  • Ricardo Garcia

Beilstein J. Nanotechnol. 2012, 3, 198–206, doi:10.3762/bjnano.3.22

Graphical Abstract
  • microscopy (SPAM) [8][28], or by making use of higher harmonics of the oscillation in order to relate the force with the observable quantity through its transfer function [11]. In particular, the torsional-harmonic cantilevers introduced by Sahin et al. allowed the reconstruction of the effective elastic
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Published 07 Mar 2012
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